Publications

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Filters: Author is Hochella Jr, Michael F.  [Clear All Filters]
2015
Kim B, Hochella MF.  2015.  Analytical Transmission Electron Microscopy and Scanning Transmission Electron Microscopy Techniques for the Characterization of Nanomaterial Composition, Phase and Crystallinity. Characterization of Nanomaterials in Complex Environmental and Biological Media, Frontiers of Nanoscience. 8:123-152.
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